硫化亚锡晶体SnS

货号:10834 编号:MK10834

CAS号:1314-95-0 规格:

包装:原包装进口 保质期:3个月+

保存条件:室温密封保存

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货号:10834 编号:MK10834

CAS号:1314-95-0 规格:

包装:原包装进口 保质期:3个月+

保存条件:室温密封保存

请选择规格参数

  • ≧ 10 mm
购买数量
 样品名称硫化亚锡晶体SnS
 性质间接带隙半导体
带隙

块体:1.4 eV

单层:1.9 eV

 参数

 尺寸:>10 mm

 应用 半导体电子器件,传感器-探测器,非线性光学,STM-AFM实验,光学器件等研究
 其他信息

 详情请发邮件至:mknano@126.com

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Product Description

 Tin sulfide (SnS) is a layered monochalcogenide semiconductor crystallizing in orthorhombic phase. The layers of cations are separated only by van der Waals (vdW) forces that provide intrinsically chemically inert surface without dangling bonds and surface density of states. Theoretical predictions show that SnS band gap values span from 1.4 eV to 1.9 eV from bulk to monolayer. SnS layers exhibit high in-plane anisotropy and high carrier mobility reaching as high as tens of thousands of cm2V–1s–1 which is superior to that of black phosphorus [1]. Their potential uses include photovoltaics, high electron mobility transistors, and catalytic energy conversion technologies. Our SnS crystal exhibit 99.9999% guaranteed purity, low defect concentration (<1E9cm-2), and high crystallinity. SnS crystals are grown either through flux vapor transport (flux method) or Bridgman technique.

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